Secondary Electron Imaging
Secondary Electron Imaging - Related Videos
06:10
Live Imaging of Mouse Secondary Palate Fusion
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Cited by 10 •
2017
Here, we present a protocol for live imaging of mouse secondary palate fusion using confocal microscopy. This protocol can be used in combination with a variety of fluorescent reporter mouse lines, and with pathway inhibitors for mechanistic insight. This protocol can be adapted for live imaging in other developmental systems.
07:50
Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Cited by 22 •
2015
The use of electron channeling contrast imaging in a scanning electron microscope to characterize defects in III-V/Si heteroexpitaxial thin films is described. This method yields similar results to plan-view transmission electron microscopy, but in significantly less time due to lack of required sample preparation.
01:55
Secondary Active Transport
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2026
One example of how cells use the energy contained in electrochemical gradients is demonstrated by glucose transport into cells. The ion vital to this process is sodium (Na+), which is typically present in higher concentrations extracellularly than in the cytosol. Such a concentration difference is due, in part, to the action of an enzyme “pump” embedded in the cellular membrane that actively expels Na+ from a cell. Importantly, as this pump contributes to the high concentration of...
03:25
Imaging of Neuronal Mitochondria Using a Serial Block-Face Scanning Electron Microscope
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2025
Source: Mukherjee, K., et. al. Analysis of Brain Mitochondria Using Serial Block-Face Scanning Electron Microscopy. J. Vis. Exp. (2016)This video demonstrates the preparation, imaging, and analysis of mouse brain tissue using a serial block-face scanning electron microscope (SBFSEM) to visualize mitochondrial ultrastructure, enabling precise mapping of their morphology and spatial distribution in axonal and dendritic neuronal compartments.
07:07
Tumor Hypoxia Assessment: In Vivo 3D Oxygen Imaging Through Electron Paramagnetic Resonance
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Cited by 1 •
2025
Quantitative 3D oxygen maps of murine tumors were imaged noninvasively using Pulse Electron Paramagnetic Resonance. Ultrasound B-mode and Power Doppler were used for anatomy and vascular structure. Images from both modalities were superimposed enabling multi-parametric tumor analysis.
FAQs
Contrast in Secondary Electron Imaging is governed by how readily near-surface regions contribute detected electrons as the beam scans. Ridges, edges, and textured areas can produce stronger or changing signals than comparatively flat regions, so brightness variations map local surface form. This makes the technique especially informative for fine morphological features.
The low-energy signal comes from only a near-surface region, which limits the image’s sensitivity to material buried beneath the exterior. As a result, Secondary Electron Imaging emphasizes surface condition rather than internal structure. In engineering examinations, that surface weighting helps distinguish morphology, roughness, edge features, and wear-related changes.
Signal variations become scientifically useful when interpreted alongside the specimen’s processing and performance history. A visible texture, defect, or wear feature can provide evidence for how fabrication conditions shaped the surface and how that microstructure may relate to mechanical performance. This supports analysis connecting processing conditions, near-surface structure, and engineering behavior.
An examination proceeds by directing a focused primary electron beam across the specimen in a controlled scan, while a detector collects the secondary electrons released from the scanned locations. The system converts changing detector intensity into image contrast. Reviewing those patterns then allows investigators to assess surface morphology and fine structural detail.
For engineering materials, the technique can be applied to coatings, microfabricated devices, and fractured components as well as broader material surfaces. Each application uses surface-sensitive contrast to inspect a different engineering concern, such as coating condition, device morphology, or fracture-surface detail. The observations help organize targeted evaluation of component condition.
Secondary Electron Imaging supports defect identification, surface-roughness characterization, and wear assessment. These observations can be compared with processing conditions to investigate why a feature developed, or with mechanical-performance results to examine its engineering significance. The method therefore provides a visual link between near-surface morphology and the behavior of manufactured or failed components.